on front Contact front-front alignment & exposure |
|
Alignment side |
front |
Alignment tolerance Registration of CAD data to features on wafer |
0.5 µm |
Batch size |
1 |
Feature geometry Shape of feature with dimensions characterized by the minimum feature size |
line |
Max field size |
4 inch |
Min feature size |
1 µm |
Process duration |
11 min |
Sides processed |
either |
Wafer size |
|
Equipment |
Karl Suss MA6 Contact Aligner |
Equipment characteristics: |
Wafer geometry Types of wafers this equipment can accept |
no-flat, 1-flat, 2-flat |
Wafer holder Device that holds the wafers during processing. |
glass plate |
Wafer materials List of wafer materials this tool can accept (not list of all materials, just the wafer itself). |
gallium arsenide, glass (category), quartz (single crystal), silicon, silicon on insulator, silicon on sapphire |
Wafer thickness List or range of wafer thicknesses the tool can accept |
200 .. 4000 µm |
Comments: |
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