|
Process characteristics: |
Beam spot diameter Area of the beam used to write the mask |
|
Defect density Density (by area) of defects of a given size (e.g., 1dpsi@1.0um) if known. |
|
Magnification Magnification factor of layout file to image on mask. |
|
Mask coating material Select preferred mask coating material (if known).
|
|
Mask plate dimensions Overall length/width/thickness of mask (ie. 5x5x0.09"). |
|
Material Select preferred mask material (if known). |
|
Min feature size Dimension of smallest feature to be realized on mask. |
|
Equipment |
|