Photoresist develop (Shipley 1827) |
|
Batch size |
1 |
Developer Agent that reacts with masking layer (e.g., photoresist) to etch it selectively. |
MF-319 |
Material |
Shipley 1827 |
Selectivity Primary material removal rate divided by removal rates of secondary materials (i.e., factors by which primary material is removed faster than secondary materials) |
Shipley 1827: 1 |
Sides processed |
both |
Temperature |
25 °C |
Wafer size |
|
Equipment |
Wet etch bench |
Equipment characteristics: |
Piece dimension Range of wafer piece dimensions the equipment can accept |
1 .. 150 mm |
Piece geometry Geometry of wafer pieces the equipment can accept |
rectangular |
Piece thickness Range of wafer piece thickness the equipment can accept |
200 .. 1000 µm |
Wafer geometry Types of wafers this equipment can accept |
1-flat, 2-flat |
Wafer holder Device that holds the wafers during processing. |
teflon boat, teflon carrier |
Wafer materials List of wafer materials this tool can accept (not list of all materials, just the wafer itself). |
quartz (fused silica), Pyrex (Corning 7740), silicon on insulator, silicon, ceramic |
Wafer thickness List or range of wafer thicknesses the tool can accept |
200 .. 1000 µm |
Comments: |
|