on front Microscope inspection |
|
Batch size |
1 |
Magnifications |
5, 10, 20, 50, 100 |
Setup time |
30 min |
Sides inspected The sides of the wafer inspected by the process |
either |
Wafer size |
|
Equipment |
Olympus microscope |
Equipment characteristics: |
Wafer geometry Types of wafers this equipment can accept |
1-flat, 2-flat |
Wafer holder Device that holds the wafers during processing. |
plastic table |
Wafer materials List of wafer materials this tool can accept (not list of all materials, just the wafer itself). |
silicon |
Wafer thickness List or range of wafer thicknesses the tool can accept |
300 .. 2500 µm |
Comments: |
|