on front   Microscope inspection  |  
  | 
        
        | Batch size | 
            1 | 
            
            | Magnifications | 
            5, 10, 20, 50, 100 | 
            
            | Setup time | 
            30 min | 
            
            | Sides inspected The sides of the wafer inspected by the process  | 
            either | 
            
            
            | Wafer size | 
            
 | 
            
            
            
            | Equipment | 
            Olympus microscope | 
            
            
            
              | Equipment characteristics: | 
            
            | Wafer geometry Types of wafers this equipment can accept  | 
            1-flat, 2-flat | 
            
            | Wafer holder Device that holds the wafers during processing.  | 
            plastic table | 
            
            | Wafer materials List of wafer materials this tool can accept (not list of all materials, just the wafer itself).  | 
            silicon | 
            
            | Wafer thickness List or range of wafer thicknesses the tool can accept  | 
            300 .. 2500 µm | 
            
            
            
              | Comments: | 
            
            
        
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