on front Silicon Nitride ICP Etch |
|
Process characteristics: |
Depth |
|
Etch rate |
0.19 µm/min |
Gas |
SF6, CF4, He |
Material |
silicon nitride |
Sides processed |
either |
Temperature |
25 °C |
Wafer size |
|
Equipment |
VLR 700 Cluster - Fluorine Dielectric Etch Chamber |
Equipment characteristics: |
Batch sizes |
100 mm: 25 |
Wafer geometry Types of wafers this equipment can accept |
1-flat |
Wafer holder Device that holds the wafers during processing. |
cassette |
Wafer materials List of wafer materials this tool can accept (not list of all materials, just the wafer itself). |
quartz (fused silica), sapphire, silicon, silicon on insulator |