on front Contact photolithography (front-back align) (AZ 9260) |
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Material | HMDS | Thickness | 1 nm |
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Process characteristics: |
Perform hard bake |
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Resist thickness |
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Excluded materials |
gold (category), copper |
Feature geometry Shape of feature with dimensions characterized by the minimum feature size |
line |
Field geometry Shape of field with dimensions characterized by the maximum field size |
circle |
Magnification |
1 |
Material |
AZ 9260 |
Max field size |
90 mm |
Min feature size |
5 µm |
Wafer size |
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Comments: |
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Extra terms |
Customer agrees that wafers, masks, and other materials
incorporating any process(es) provided by this fabrication site
are to be used solely for non-commercial research
purposes.
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