Process Hierarchy

on front
  Spectrophotometric film thickness measurement
Materials silicon nitride
Measurement aspect thickness
Measurement unit Ang
Refractive index 1 .. 4
Sides inspected
The sides of the wafer inspected by the process
either
Thickness 0 .. 5 µm
Wafer size
Wafer size
Equipment Nanospec
Equipment characteristics:
Batch sizes 100 mm: 1, 125 mm: 1, 150 mm: 1
MOS clean no
Piece dimension
Range of wafer piece dimensions the equipment can accept
2 .. 150 mm
Piece geometry
Geometry of wafer pieces the equipment can accept
circular, irregular, other, rectangular, triangular shard
Piece thickness
Range of wafer piece thickness the equipment can accept
200 .. 1000 µm
Wafer geometry
Types of wafers this equipment can accept
1-flat, 2-flat, no-flat, notched
Wafer materials
List of wafer materials this tool can accept (not list of all materials, just the wafer itself).
Pyrex (Corning 7740), quartz (fused silica), silicon, silicon on insulator
Wafer thickness
List or range of wafer thicknesses the tool can accept
200 .. 1000 µm