Process Hierarchy

  Undoped polysilicon LPCVD
Process characteristics:
Thickness of material to be deposited.
Thickness of material to be deposited., must be 0 .. 2 µm
0 .. 2 µm
Batch size 25
Deposition rate
Rate at which material is added to a wafer
0.0137 µm/min
Material polysilicon
Measured film thickness variation (+/- %) 9.8
Pressure of process chamber during processing
400 mTorr
Sides processed both
Temperature 620 °C
Wafer size
Wafer size
Equipment Tylan Furnace (Poly, Tube #9)
Equipment characteristics:
Wafer geometry
Types of wafers this equipment can accept
no-flat, 1-flat, 2-flat
Wafer holder
Device that holds the wafers during processing.
quartz boat
Wafer materials
List of wafer materials this tool can accept (not list of all materials, just the wafer itself).
silicon, silicon on insulator
Wafer thickness
List or range of wafer thicknesses the tool can accept
300 .. 600 µm
  • Setup time includes loading and unloading the tube, pump down, purge, and stabilization time.