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Process characteristics: |
Process duration Running time of the process (excluding setup/shutdown time) |
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Temperature Maximum temperature the substrate reaches during a process |
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Ambient Ambient to which substrate is exposed during processing |
nitrogen |
Batch size |
50 |
Excluded materials |
gold (category), copper |
Pressure Pressure of process chamber during processing |
760 Torr |
Sides processed |
both |
Wafer size |
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Equipment |
MRL furnace 322-3 |
Equipment characteristics: |
Wafer holder Device that holds the wafers during processing. |
quartz |
Wafer materials List of wafer materials this tool can accept (not list of all materials, just the wafer itself). |
silicon, Borofloat (Schott), quartz (single crystal) |
Wafer thickness List or range of wafer thicknesses the tool can accept |
200 .. 1000 µm |
Comments: |
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Extra terms |
Customer agrees that wafers, masks, and other materials
incorporating any process(es) provided by this fabrication site
are to be used solely for non-commercial research
purposes.
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