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| Process characteristics: |
| Cuts per wafer Number of cuts per wafer |
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| Die separation (X-direction) The distance between cuts in X-direction. |
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| Die separation (Y-direction) The distance between cuts in Y-direction. |
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| Wafer size |
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| Equipment |
ADT7134 |
| Equipment characteristics: |
| Batch sizes |
50 .. 300 mm: 1 |
| MOS clean |
no |
| Wafer geometry Types of wafers this equipment can accept |
1-flat, 2-flat, notched, no-flat |
| Wafer materials List of wafer materials this tool can accept (not list of all materials, just the wafer itself). |
silicon on insulator, fused silica, gallium arsenide, quartz (fused silica), silicon, Borofloat (Schott), glass (Hoya) |
| Wafer thickness List or range of wafer thicknesses the tool can accept |
300 .. 2000 µm |
| Comments: |
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