on front Titanium DC magnetron sputtering |
|
Process characteristics: |
Power Microwave power radiated into substrates being bonded |
|
Thickness |
|
Batch size |
12 |
Deposition rate Rate at which material is added to a wafer |
120 .. 3000 Å/min |
Material |
titanium |
Pressure Pressure of process chamber during processing |
5 mTorr |
Sides processed |
either |
Temperature |
27 °C |
Wafer size |
|
Equipment |
Varian XM8 Sputterer
|
Equipment characteristics: |
MOS clean |
no |
Wafer geometry Types of wafers this equipment can accept |
1-flat, 2-flat, no-flat, notched |
Wafer holder Device that holds the wafers during processing. |
stainless steel |
Wafer materials List of wafer materials this tool can accept (not list of all materials, just the wafer itself). |
alumina, BK7, Borofloat (Schott), ceramic, copper, Corning 1737, Foturan (Schott), fused silica, gallium arsenide, gallium phosphide, germanium, glass (Hoya), glass-ceramic, indium phosphide, lithium niobate, other, Pyrex (Corning 7740), quartz (fused silica), quartz (single crystal), sapphire, silicon, silicon carbide, silicon germanium, silicon on insulator, silicon on sapphire, titanium |
Wafer thickness List or range of wafer thicknesses the tool can accept |
300 .. 2000 µm |