on front   Ti DC-magnetron sputtering  |  
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              | Process characteristics: | 
            
            | Thickness Amount of material added to a wafer  | 
             | 
            
            | Ambient Ambient to which substrate is exposed during processing  | 
            argon | 
            
            | Deposition rate Rate at which material is added to a wafer  | 
            0.0144 µm/min | 
            
            | Material | 
            titanium | 
            
            | Pressure Pressure of process chamber during processing  | 
            5 mTorr | 
            
            | Sides processed | 
            either | 
            
            
            | Wafer size | 
            
 | 
            
            
            
            | Equipment | 
            CVC 610  | 
            
            
            
              | Equipment characteristics: | 
            
            | Batch sizes | 
            100 mm: 5, 150 mm: 5, 50 mm: 12, 75 mm: 5 | 
            
            | Wafer geometry Types of wafers this equipment can accept  | 
            1-flat, 2-flat, notched, no-flat | 
            
            | Wafer materials List of wafer materials this tool can accept (not list of all materials, just the wafer itself).  | 
            fused silica, silicon, silicon on insulator | 
            
            | Wafer thickness List or range of wafer thicknesses the tool can accept  | 
            300 .. 1000 µm |