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Amorphous silicon LPCVD: View
Process Hierarchy
Bonding
Clean
Consulting
Deposition
Evaporation
LPCVD
Low-stress SiN deposition
Miscellaneous deposition
Oxidation
PECVD
Spin casting
Sputtering
Doping
Etch
LIGA
Lift off
Lithography
Mask making
Metrology
Miscellaneous
Packaging
Polishing
Process technologies
Thermal
Unique capabilities
If you are interested in this process, either by itself or as part of a longer processing sequence, please send us email at
engineering@mems-exchange.org
or call us at (703) 262-5368
Amorphous silicon LPCVD
Process characteristics:
Thickness
Thickness of material to be deposited.
Thickness
*
µm
nm
Thickness of material to be deposited., must be 0.05 .. 0.2 µm
0.05 .. 0.2 µm
Ambient
Ambient to which substrate is exposed during processing
silane
Material
amorphous silicon
Sides processed
both
Temperature
565 °C
Wafer size
Wafer size
100 .. 200 mm
Equipment
Furnace - Silicon
Equipment characteristics:
Batch sizes
100 .. 200 mm: 25
Wafer geometry
Types of wafers this equipment can accept
1-flat, 2-flat, notched, no-flat
Wafer materials
List of wafer materials this tool can accept (not list of all materials, just the wafer itself).
silicon on insulator, silicon
Wafer thickness
List or range of wafer thicknesses the tool can accept
300 .. 700 µm