Anodic bonding (air, with alignment) |
|
| Alignment type Method used to align materials to be bonded. |
optical |
| Ambient Ambient to which substrate is exposed during processing |
air |
| Duration |
30 min |
| Pressure Pressure of process chamber during processing |
1 atm |
| Temperature |
400 °C |
| Voltage |
800 V |
| Wafer size |
|
| Equipment |
Wafer bonder |
| Equipment characteristics: |
| Batch sizes |
100 mm: 2, 25 mm: 2, 50 mm: 2, 75 mm: 2 |
| MOS clean |
no |
| Wafer geometry Types of wafers this equipment can accept |
1-flat, 2-flat, no-flat, notched |
| Wafer materials List of wafer materials this tool can accept (not list of all materials, just the wafer itself). |
Borofloat (Schott), Pyrex (Corning 7740), silicon |
| Wafer thickness List or range of wafer thicknesses the tool can accept |
300 .. 1000 µm |