Process Hierarchy

on front
  Direct laser write lithography (Manual)
MaterialHMDS
on front
  4 Direct laser write
Resist thickness1 .. 6 µm
Process characteristics:
Min feature size
Min feature size*
must be 0.5 .. 10 µm
0.5 .. 10 µm
Perform microscope inspection
One measurement per wafer
Perform microscope inspection*
yes no
One measurement per wafer
Time
Time*
must be 15 .. 480 min
15 .. 480 min
Alignment side front
Batch size 1
Magnification 1
Material AZ 5214e
Perform hardbake yes
Resist thickness 1 .. 5 µm
Wafer size
Wafer size