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10X G-line photolithography (Shipley SPR 220-7): View
Process Hierarchy
Bonding
Clean
Consulting
Deposition
Doping
Etch
LIGA
Lift off
Lithography
Contact mask lithography
Maskless lithography
Miscellaneous lithography
Projection mask lithography
Mask making
Metrology
Miscellaneous
Packaging
Polishing
Process technologies
Thermal
Unique capabilities
If you are interested in this process, either by itself or as part of a longer processing sequence, please send us email at
engineering@mems-exchange.org
or call us at (703) 262-5368
on front
10X G-line photolithography (Shipley SPR 220-7)
Down
1
Dehydration bake
2
HMDS prime
Material
HMDS
on front
3
Photoresist coat (Shipley 220)
Thickness
10 µm
on front
4
Photoresist softbake
on front
5
Stepper front-front alignment
Down
on front
6
10X stepper G-line exposure
Down
on front
7
Photoresist develop (Shipley 220)
on front
8
Microscope inspection
Batch size
1
Feature geometry
Shape of feature with dimensions characterized by the minimum feature size
line
Field geometry
Shape of field with dimensions characterized by the maximum field size
square
Magnification
10
Material
Shipley SPR220-7
Max field size
10 mm
Min feature size
8 µm
Resist thickness
10 µm
Wafer size
Wafer size
100 mm